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Issue Date Title Author(s) Journal View
2016-07

Park, Jun Cheol Lee, Kyoung Ryun Heo, Hoseok Kwon, Se-Hun Kwon, Jung-Dae Lee, Myoung-Jae Jeon, Woojin Jeong, Seong-Jun Ahn, Ji-Hoon

Crystal Growth and Design, v.16, no.7, pp.3884 - 3889, 2016-07

760
2017-07

Hyun, Cheol-Min Choi, Jeong-Hun Lee, Myoung-Jae Ahn, Ji-Hoon

Applied Physics Letters, v.111, no.1, pp.013104, 2017-07

476
2017-09

Shim, Hyunseok Allabergenov, Bunyod Kim, Joonwoo Noh, Hee Yeon Lyu, Hong-Kun Lee, Myoung-Jae Choi, Byeongdae

Advanced Materials Technologies, v.2, no.9, 2017-09

1085
2019-02 557
2018-09

Lee, Myoung-Jae Park, Gyeong-Su Seo, David Hyungseok Kwon, Sung Min Lee, Hyeon-Jun Kim, June-Seo Jung, Minkyung You, Chun-Yeol Lee, Hyangsook Kim, Hee-Goo et al

ACS Applied Materials & Interfaces, v.10, no.35, pp.29757 - 29765, 2018-09

699
2012-06

Chung, U-In Kim, Young-Bae Lee, Seung Ryul Lee, Dongsoo Lee, Chang Bum Chang, Man Kim, Kyung min Hur, Ji Hyun Lee, Myoung-Jae Kim, Chang Jung

Wiley-VCH Verlag GmbH & Co. KGaA, 2012-06

230
2016-12

Multilevel resistance in ZnO nanowire memristors enabled by hydrogen annealing treatment

Lee, Sunghun Park, Jung-Bong Lee, Myoung-Jae Boland, John J.

AIP Advances, v.6, no.12, 2016-12

642
2016-07 594
2018-08

Improved distribution of resistance switching through localized Ti-doped NiO layer with InZnOx/CuOx oxide diode

Song, Min Ho Lee, HyunKi Seo, David Hyungseok Lee, Hyeon-Jun Kim, June-Seo Cho, Hui-Sup Lyu, Hong-Kun Seo, Sun Ae Lee, Myoung-Jae

Institute of Electrical and Electronics Engineers Inc., 2018-08

792
2017-08

Impact of transient currents caused by alternating drain stress in oxide semiconductors

Lee, Hyeon-Jun Cho, Sung Haeng Abe, Katsumi Lee, Myoung-Jae Jung, Minkyung

Scientific Reports, v.7, no.1, pp.9782 - 9790, 2017-08

647
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